Building and exploring libraries of atomic defects in graphene: Scanning transmission electron and scanning tunneling microscopy study

Application of Scanning Electron and Atomic Force Mode Microscopy on inscription from Proto-Elamite period in Tappeh Sofalin

The study of cultural heritage artifacts and the research of a protection and restoration intervention create with - and are often limited to - a complete characterization of their surface. This is not only factual for museum objects, but also for archaeological artifacts, because the object as it was discovered may contain precious unknown information that could be lost by too much aggressive ...

Scanning Transmission Electron Microscopy of Metal- Graphene Interaction

Secondary Electron Trajectories in Scanning Tunneling Microscopy

The recently developed technique Scanning Tunneling Microscopy in the Field Emission regime (STM FE) is based on the Russell Young's topografiner technology [1]. The set-up is a no contacting device consisting of a sharp tip approached vertically to a conducting surface at variable distances and biased with a small voltage with respect to the surface (Figure 1). The system builds a junction acr...

Direct observations of atomic diffusion by scanning transmission electron microscopy.

The feasibility of using a high-resolution scanning transmission electron microscope to study the diffusion of heavy atoms on thin film substrates of low atomic number has been investigated. We have shown that it is possible to visualize the diffusion of individual uranium atoms adsorbed to thin carbon film substrates and that the observed motion of the atoms does not appear to be induced by th...

15. Scanning Transmission Electron Microscopy